The DHT® Chamber for Memory Environmental Testing System is a specialized aging test solution tailored for semiconductor memory (DRAM, NAND, etc.), serving chip manufacturers, tester companies, and memory developers. With the surge in storage demand driven by data centers, mobile communications, and AI, the market has entered a “supercycle,” making cost-efficiency and test throughput critical. DHT® models such as the DHT-H5620 and DHT-AF8652 integrate both Burn-In (BI) and Core testing functions, supporting ultra-wide temperature ranges from -40°C to 150°C, temperature uniformity within 0.4°C, and multi-slot parallel testing. These systems enable efficient, high-volume memory testing, helping clients achieve scalability and profitability in the era of rapid data growth.