Der DHT® Chiller für Halbleitertests ist ein hochpräzises Kühlgerät, das speziell für Halbleiterfertigungs- und -testprozesse entwickelt wurde, einschließlich Wafer-Tests, Chip-Aging-Tests und ATE-Testsysteme. Das Gerät sorgt für eine stabile, schnelle und kontrollierbare Temperaturumgebung für Halbleiterprozesse und gewährleistet so Produktleistung und -ertrag.
Ultra-High Temperature Control Precision: The temperature control accuracy is ±0.1°C, effectively controlling temperature fluctuations during chip testing, ensuring data stability and testing consistency.
Rapid Thermal Response Capability: The chiller features fast heating and cooling capabilities, meeting the diverse testing rhythms required, significantly improving testing efficiency and operational cycles.
Ultra-Low Noise and Vibration Design: The device uses noise reduction technologies and vibration-damping structures, making it ideal for semiconductor cleanrooms and high-precision testing environments.
High Reliability and Long Lifespan: Industrial-grade core components are used, and the entire system supports continuous operation 24/7, ensuring long-term stability and reliability of the testing system.
Intelligent Control System: Equipped with a human-machine interface, the chiller supports remote monitoring, parameter settings, and self-diagnostic functions, making it easy to integrate into automated testing platforms.
| Model | SE8 | SE14 | SE24 | SE50 | SE65 |
| SE8W | SE14W | SE24W | SE50W | SE65W | |
| Temperature Range | -45°C-40°C | ||||
Doaho Test Equipment (Shanghai) Co., Ltd.
Gebäude 23, Nr. 3398 Puwei Road
Bezirk Fengxian, Shanghai, China
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