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The DHT® Chamber for Memory Environmental Testing System is a specialized aging test solution tailored for semiconductor memory (DRAM, NAND, etc.), serving chip manufacturers, tester companies, and memory developers. With the surge in storage demand driven by data centers, mobile communications, and AI, the market has entered a “supercycle,” making cost-efficiency and test throughput critical. DHT® models such as the DHT-H5620 and DHT-AF8652 integrate both Burn-In (BI) and Core testing functions, supporting ultra-wide temperature ranges from -40°C to 150°C, temperature uniformity within 0.4°C, and multi-slot parallel testing. These systems enable efficient, high-volume memory testing, helping clients achieve scalability and profitability in the era of rapid data growth.
Le DHT® Chamber for Memory Environmental Test System (High-Speed Aging BI) est une solution de test de vieillissement avancée spécialement développée pour les mémoires semi-conductrices telles que les DRAM et les NAND. Elle est largement utilisée par les fabricants de puces, les fournisseurs de testeurs et les instituts de R&D sur les mémoires. Les modèles tels que le DHT-H5620 et le DHT-AF8652 intègrent à la fois des capacités de test de déverminage (BI) et de test du noyau. Ces systèmes prennent en charge une plage de température ultra large [...]
Doaho Test Equipment (Shanghai) Co, Ltd.
Bâtiment 23, No. 3398 Puwei Road
District de Fengxian, Shanghai, Chine
