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The DHT® Highly Accelerated Life Test (HALT) Chamber is a high-performance reliability testing system specifically engineered for the product development stage of electronic and electromechanical devices. By applying stress levels far beyond normal operating conditions, it rapidly uncovers potential design flaws, manufacturing defects, and material weaknesses. The system simulates a range of combined stress environments—including extreme temperature fluctuations, high humidity, six-degree-of-freedom random vibration, and thermal shock—significantly accelerating product aging within a short period and revealing early failure modes that are often difficult to detect during regular service life.
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